Abstract: A generalized and fast multidomain phase-field-based compact model for the metal-ferroelectric-metal (MFM) capacitor is presented. Time-dependent Landau–Ginzburg (TDGL) and Poisson’s ...
Abstract: The total ionizing dose (TID) is a well-known reliability issue for integrated circuits (ICs). It consists in changes of MOSFETs dc characteristics following the irradiation of devices in a ...
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