Combining Cor Van Rij's JFET test socket with two DMMs, a current limiter, switches and a wall wart yield a simple, accurate ...
3D-IC technology marks a pivotal shift from scaling in two dimensions to scaling in three. By bringing compute, memory, and ...
Current Degradation in Ultra-Scaled Nanosheet FETs with S/D Underlap Doping” was published by researchers at Global TCAD ...
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