Embedded systems engineers face significant challenges in adding intelligence to myriad real-world applications. To succeed, they must select the proper tools to get their products ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG ...

The recent Royal National Institute of Blind People ‘Design For Everyone’ campaign aims to acknowledge that people have a shared humanity, using the issue of pregnancy test results to ...

Built-in self-test is more than just test, it includes repair of failed circuits.

MCRE will be the world’s first test of a fast-spectrum, salt-fueled reactor design. It is a public-private partnership led by ...