The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...

Yield ramp has historically been the fab's burden. The yield ramp cycle was cleanly partitioned into three phases: process development, pilot production and volume production (Fig. 1). 1. Industry has ...

The reference or demodulated signal can be predetermined and stored as part of the test program. One method using EVM not only makes it possible to increase test coverage via system-level testing, but ...

The use of optically-networked assemblies in defense and aerospace weapon systems is growing rapidly, and the optical test capabilities of the associated ATE is generally inadequate to provide ...

Counterfeit electronic components are an increasing threat to the supply chain for consumer, industrial and, more importantly, military parts. Some counterfeit parts are like counterfeit money, ...