Testing multiple devices in parallel using the same ATE results in reduced test time and lower costs, but it requires engineering finesse to make it so. Minimizing test measurement variation for each ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

This is a preview. Log in through your library . Abstract A two-dimensional potential flow in an unbounded domain with two parallel plates is considered. We examine whether two free point vortices can ...

A hands-on introduction to parallel programming and optimizations for 1000+ core GPU processors, their architecture, the CUDA programming model, and performance analysis. Students implement various ...